From April 1, 2015, the Optical NanoGauge C13027 will be available to manufacturers of systems for the fabrication or inspection of films, flat panel displays, semiconductor coatings, and thin film deposition. From April 8 to 10, 2015, the Optical NanoGauge C13027 will be exhibited at FilmTech Japan, a specialised trade show within the Highly-functional Material World 2015 exposition to be held at the Tokyo Big Sight convention center.
Hamamatsu Introduces Optical Nanogauge System For Film Thickness Measurement
C13027 Optical NanoGauge film thickness measurement system
Hamamatsu Photonics K.K. has developed a new film thickness measurement system, the Optical NanoGauge C13027, which offers easier integration into inline manufacturing equipment thanks to its reduced size and compatibility with automation controllers. The new system’s footprint is roughly 30 percent smaller than previous systems. Furthermore, the Optical NanoGauge C13027 can help improve quality control with the inclusion of a color measurement function that checks the evenness of colors of films and flat panel display during thickness measurement. The Optical NanoGauge C13027 also provides double the measurement speed of previous systems.
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